This device was developed for heating integrated circuits or other semiconductor devices in process of radiation-hardness testing. Developed device have different modes of operation depending from what type of heating element is used.

1. Resistor. If we connect to output of the device just resistor, it will be automatically recognized and will propose to user enter the desired current which will flow through resistor. Of course, limited by Ohms law.
2. Resistor with diode. It's special configuration, where diode used as temperature sensor. The device automatically recognizes diode and use it as sensor to provide desired temperature of resistor. Good thermal contact should be provided between diode and resistor. And calibration of diode must be made beforehand.
3. MOSFET. Most sophisticated mode where intrinsic diode of N-channel MOSFET used as thermal sensor. In this mode heating device controls current through MOSFET by adjusting gate voltage and controlling temperature by measuring forward voltage of body diode of MOSFET. Calibration must be provided as well.

For calibration purposes the device is equipped with K-type thermocouple that user can use for making calibration of diodes and MOSFETS. Device have 25 memory slots for saving different heating elements calibration curves.

Link to Git repository